Thin film CIGS PV maker orders Dark Field inspection tools

Dark Field Technologies won an order for multiple thin film PV inspection and metrology systems with a value in excess of US$500,000 from a top tier manufacturer of high-efficiency copper indium gallium di-selenide (CIGS) solar cells.

May 18, 2011 — Dark Field Technologies, thin film PV inspection and metrology tool supplier, won an order for multiple systems with a value in excess of US$500,000 from a top tier manufacturer of high-efficiency copper indium gallium di-selenide (CIGS) thin film panels.

NxtGen Scribe 100 is an on-line, real-time, 100% solar cell scribe metrology system, which is coupled with NxtGen Wash to acheive on-line haze measurement, washer debris detection, glass defects and length/width/squareness measurement. The NxtGen Scribe 100 metrology technology uses dark field optics and high-speed scan cameras to inspect on-line P1, P2 and P3 scribing operations. NxtGen Wash detects edge chips/cracks and broken corners/flairs, TCO coating defects and washer residue, panel warp/thickness or concentrator profile at ±15 microns. Over 500 million pixels are captured and analyzed in 3 seconds.

Every system we sell is custom-designed and produced for individual customers, said Dark Field president Tim Potts.

Dark Field Technologies provides laser and camera inspection and metrology systems for the solar thin film plastic film, displays, glass, electronics and semiconductor industries. Learn more at www.darkfield.com.

Also read: Time-domain tailored-pulse laser enables scribing of CIGS solar modules

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