Solar cell and module makers must increase yields and improve quality, while lowering costs, to meet market demands. A June 14 webcast, sponsored by National Instruments and Teledyne DALSA, will examine automated vision systems that can help satisfy these needs.
June 13, 2011 — Solar cell and module makers must increase yields and improve quality, while lowering costs, to meet market demands.
Automated inspection systems based on machine vision can help satisfy these demands. Tomorrow’s webcast, presented by Photovoltaics World partner publication Vision Systems Design, “Machine Vision for Solar Cell Inspection,” will help engineers and system integrators understand how to integrate hardware subsystems, solar cell transport, image acquisition and processing, lighting, and data management software.
Webcast presenters will examine the mechanical constraints that must be considered when developing solar cell wafer inspection systems and how image processing tools such as blob analysis and edge detection can be used to measure the features of each wafer.
Register for the webcast, June 14, 2011, 1:00 PM EST, at http://video.webcasts.com/events/pmny001/viewer/index.jsp?eventid=38800&adid=EIQ
The webcast is sponsored by National Instruments and Teledyne DALSA.