Startup validates metrology tool at Signet Solar

BrightView Systems says it has successfully integrated and validated its wide-area metrology (WAM) process metrology and mapping system at Signet Solar’s thin-film PV production line in Mochau, Germany.

October 14, 2009 – BrightView Systems says it has successfully integrated and validated its wide-area metrology (WAM) process metrology and mapping system at Signet Solar’s thin-film PV production line in Mochau, Germany.

The company, which uses micro-crystalline silicon thin-film PV technology licensed from Applied Materials, realized “fully automated continuous full-panel process monitoring on 100% of production panels,” reducing reliance on offline measurements and test panel cycles.

“The BrightView solution fills a major gap in the industry’s transition from pilot to mass production, providing true 24/7 in-line process monitoring while saving long and tedious off-line cycles and test panels,” said Gunter Ziegenbalg, managing director of Signet Solar GmbH, in a statement. The company’s R&D engineers are generating data needed for concrete process improvements and optimization, while production engineers who need continuous automatic alerts of process issues and faster turnaround after process tool maintenance.

“We are excited by the excellent results they achieved, and look forward to continue working with Signet Solar on their next production milestone and process improvement roadmap, as well as accelerate efficiency and productivity gains for the thin film PV industry,” added Benny Shoham, CEO of BrightView.

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