Solar

PV wafer handler from Owens Design boasts high throughput, low breakage

Owens Design Inc., equipment design and build service provider, launched an automation platform for production-volume, high-speed crystalline silicon (c-Si) photovoltaic (PV) wafer inspection.

October 5, 2011 — Owens Design Inc., equipment design and build service provider to the solar, semiconductor, and data storage capital equipment markets, launched an automation platform for production-volume, high-speed crystalline silicon (c-Si) photovoltaic (PV) wafer inspection.

The Owens Design c-Si Inspection Automation Platform can be customized for different configurations, targeting high speed and high reliability wafer handling. Input load modules can be configured for cassette or coin stack input. The output sorter module can host 6 to 18 output bins. The platform can be configured for 125mm2 or 156mm2 PV wafers. Throughput hits 3600 wafers per hour (WPH); breakage rate is <0.2%.

Wafer inspection maximizes yields at high-volume photovoltaics fabs, noted John Apgar, Owens Design president. The handling system is designed for use with high-volume solar wafer inspection systems.

Also read Owens Design’s blog on the right way to outsource.

Owens Design will highlight the new platform at Solar Power International 2011 (SPI), Booth 4842, at the Dallas Convention Center, October 18-20.

Owens Design helps capital equipment manufacturers reduce tool development costs, minimize technical risk and speed their time to market. Owens Design provides the system-integration platform for an OEM?s core technology. For more information about Owens Design?s products and services, please visit www.owensdesign.com.

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