Monitoring, Solar

LayTec in-line metrology tool inspects CIGS, CdTe at production speeds

LayTec will unveil the in-line metrology system PearL at Intersolar Europe 2011. The optical in-line monitoring system measures photoluminescence spectra of CIGS thin-film modules in production lines, and a product option for CdTe absorbers is also available.

May 27, 2011 — LayTec will unveil the in-line metrology system PearL at Intersolar Europe 2011 in Munich, June 8-10. The optical in-line monitoring system measures photoluminescence spectra of CIGS thin-film modules in production lines, and a product option for CdTe absorbers is also available.

Photoluminescence spectra allow fast detection of the absorber’s effective Ga content, during production. LayTec’s advanced LASER stimulated spectral photoluminescence (sPL) technology, an alternative to integral imaging solutions (iPL), characterizes PV absorber layers at production line speeds. Continuous photoluminescence spectra recording enables process and quality control. PearL delivers fast quantitative material parameters based on the spectroscopic response.

LayTec collaborated with semiconductor scientists to develop PearL.

It can be combined with the LayTec SolR, which provides uniformity control of film deposition from center to edge of each thin-film module.

LayTec develops, manufactures and markets optical in-situ and in-line metrology systems for thin-film processes with a focus on compound semiconductor and photovoltaic applications. For further information, visit http://www.laytec.de/

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