Spire’s Spi-EL tester provides high-resolution inspection for solar modules in production. The Spi-EL series of solar module testers use electroluminescence (EL) to identify microcracks and other invisible defects in modules.
February 23, 2011 – BUSINESS WIRE — Spire Corporation (Nasdaq: SPIR), a global solar company providing capital equipment and turn-key manufacturing lines to produce photovoltaic (PV) modules, introduced an advanced metrology product, the Spi-EL electroluminescence solar module tester, at the SNEC 5th (2011) International Photovoltaic Power Generation and Exhibition in Shanghai, China.
The Spi-EL series of solar module testers use electroluminescence (EL) to identify microcracks and other invisible defects in modules. The testers utilize cooled near-infrared charge-coupled device camera technology to image each solar cell with resolutions less than 200µm per pixel, the equivalent of a 60 megapixel image for an entire module.
Spire is exhibiting the new product at SNEC, at the Shanghai New International Expo Center, booth E3-003.
Spire Corporation is a global solar company providing capital equipment and turn-key production lines to manufacture PV modules. To learn more about Spire Corporation, visit www.SpireCorp.com
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