Solar

Solar Metrology uncrates CIGS metrology tool

Solar Metrology has released the System SMX-ILH remote static head tool, a line-mountable X-ray fluorescence tool for atmospheric CIGS composition and thickness measurement.

November 19, 2009 – Solar Metrology has released the System SMX-ILH remote static head tool, a line-mountable X-ray fluorescence tool for atmospheric CIGS composition and thickness measurement.

The tool provides composition and thickness measurements for thin-film solar PV metal film stacks on flexible roll-to-roll substrates such as stainless steel, aluminum, and polyimide, or rigid substrates such as float glass, the company claims. Two configurations are available: integrated for single/dual axis positioning to measure on stationary or moving substrates, or with a remote x-ray head incorporated directly into an air-environment production line. Remote models can measure in either one static location or linearly across the gradient of flexible or rigid glass substrates.

Typical measurement applications include Mo thickness and all CIGS combinations, including CIG alloys, film combinations, and final formulations.